
Material analysis beamline BL05 was constructed for the industrial companies’ use. In the BL05, X-ray absorption Fine Structure (XAFS) and X-ray photoelectron spectra (XPS) can be measured with a high-energy resolution. These measurements provide us the information on chemical composition, electronic states, and distance between neighboring atoms.
BL-05 consists of two branch lines, which are a double crystal monochromator beamline (BL05A) for the use in the high-energy region (1300-4000 eV) and a varied line spacing plane grating (VLSPG) monochromator beamline (BL05B) for the use in the low-energy region (50-1300 eV). As a result, the whole useful energy range of the BL-05 is the soft X-ray region from 50 to 4000 eV. These two branch lines can be employed simultaneously.
Optical element | Figure | Curvature (sagittal) (m) |
Curvature (tangential) (m) |
Coated material | Substrate material | Size LxW(mm) |
---|---|---|---|---|---|---|
M0 | Toroidal | 418.28±5% | 0.1274±5% | Au | Si | 200x30 |
M1 | Toroidal | 229.2±5% | 0.0698±5% | Au | Si | 200x30 |
Optical element | Figure | Curvature (sagittal) (m) |
Curvature (tangential) (m) |
Coated material | Substrate material | Size LxW(mm) |
---|---|---|---|---|---|---|
M0 | Sylindrical | 171.9±5% | &infin | Au | Si | 500x50 |
M1 | Sylindrical | 171.9±3% | &infin | Au | Si | 300x30 |
M2 | Spherical | 229.2±5% | 229.2±3% | Au | Si | 250x30 |
Mf | Toroidal | 114.6±5% | 0.0611±5% | Au | Si | 250x30 |
Grating | Plane | &infin | &infin | Au | Si | 200×30 |
A double crystal monochromator was mounted on BL05A. A white SR light from the bending magnet port is reflected by a toroidal focusing pre-mirror with a grazing incidence angle of 2°. Si(111) and InSb(111) crystals are prepared for a double crystal monochromator. Dispersed SR was focused into a sample stage with a toroidal mirror.
A constant-deviation monochromator consisting of a demagnifying spherical mirror and varied line spacing plane grating (VLSPG) was mounted on BL05B. The monochromator is designed to cover the energy range 50-1300 eV with three gratings. The synchrotron radiation provided by the bending magnet was focused on entrance slit using M0 and M1. Dispersed light by a monochromator was focused on the exit slit, and it was re-focused into the sample stage by Mf.
XAFS spectra can be measured in the total electron yield mode and fluorescence yield mode, using SSD (SII, Vortex) in the energy region from 1300 eV to 4000 eV. In addition, fluorescence XAFS spectra can be measured for samples at the end station filled with He gas.
Two measurement chambers are prepared at the end station of BL05B. The XAFS spectra in the total electron yield mode and fluorescence XAFS spectra using SDD (EDAX) can be measured in a high vacuum chamber. In addition, the photoelectron spectrum can be measured using spherical electron analyzer (VG Sienta. R3000) in an ultra-high vacuum chamber. The chambers can be replaced by each other within 1 hour.
electron energy [eV] |
Resolution (calc.) [meV] |
Resolution (exp.) [meV] |
Resolving power (calc.) | Resolving power (exp.) |
---|---|---|---|---|
2 | 3.0 | 2.2 | 667 | 909 |
5 | 5.0 | 4.4 | 1000 | 1136 |
10 | 10.0 | 8.8 | 1000 | 1136 |
20 | 20.0 | 16.5 | 1000 | 1212 |
Test vessel: Scinta GC-50
Scienta VUV-5000UV-source. Xe gas (purity>90 %)
The maintenance and management of BL-05 are performed by Synchrotron Analysis LLC, which is a consortium of user companies, under the supervision of the LASTI staff. If users want help with measurements of BL-5, operators of SALLC can assist them. In addition, SALLC has been accepting applications for XAFS measurement service.