○Structural analysis of amorphous carbon films by BEMA theory based on
spectroscopic ellipsometry measurement
Diamond & Related Materials 79C (2017) 46-59
XiaoLong Zhou, Satoru Arakawa, Sarayut Tunmee, Keiji Komatsu, Kazuhiro
Kanda, Haruhiko Ito, Hidetoshi Saitoh
○Soft X-ray irradiation effect on the fluorinated DLC film
Diamond & Related Materials 79C (2017) 14-20
Hiroki Takamatsu, Masahito Niibe, XiaoLong Zhou, Keiji Komatsu, Hidetoshi
Saitoh, Hiroki Akasaka, Akihiro Saiga, Koji Tamada, Masahito Tagawa,
Kumiko Yokota, Yuichi Furuyama, Kazuhiro Kanda
○ ダイヤモンドをよく知るために 〜量子ビーム利用測定技術（１）
X線吸収分光を用いた局所構造解析
NEW DIAMOND 第126号 37-40 (2017)
神田 一浩
○Formation of nanocrystalline silicon in SiOx by soft X-ray irradiation
at low temperature
Japanese Journal of Applied Physics 56, 035501 (2017)
Akira Heya, Fumito Kusakabe, Naoto Matsuo, Kazuhiro Kanda, Kazuyuki
Kohama,
Kazuhiro Ito
○ Modification Processes of Highly Hydrogenated Diamond-Like Carbon Thin
Films by Soft X-ray Irradiation
Sensors and Materials, 29 817-826 (2017)
Kazuhiro Kanda, Ryo Imai, Masahito Niibe, Hisashi Yoshioka, Keishi
Komatsu, and Hidetoshi Saitoh
○Structural analysis of amorphous carbon films by spectroscopic ellipsometry, RBS/ERDA, and NEXAFS
Journal: Appl. Phys. Lett. 110, 201902 (2017).
XiaoLong Zhou, Tsuneo Suzuki, Hideki Nakajima, Keiji Komatsu, Kazuhiro Kanda, Haruhiko Ito, and Hidetoshi Saitoh
○ＤＬＣ膜構造分析とＩＳＯ規格化
応用物理 86, 558-564 (2017)
神田 一浩 |